Preparation of SiO2:TiO2 for High-Performance Double Layer Anti-Reflection Coating

Double layer coating for high resolution low temperature SEM

Specimen damage caused by mass loss due to electron beam irradiation is a major limitation in Low Temperature Scanning Electron Microscopy of bulk specimens. At high primary magnifications (e.g. 100 000 x) a hydrated sample is usually severely damaged after one slow scan (about 3000 enm-2). The consequences of this beam damage are remarkably reduced by coating the frozen-hydrated sample with a ...

An Anti-Reflection Coating for Silicon Optics at Terahertz Frequencies

A method for reducing the reflections from silicon optics at terahertz frequencies has been investigated. In this study, we used thin films of parylene as an anti-reflection (AR) layer for silicon optics and show low-loss behavior well above 1 THz. Transmittance spectra are acquired on double-sided-parylene-coated, high-resistivity, single-crystal silicon etalons between 0.45 THz and 2.8 THz. M...

Anti-Reflection Coating for Nitrogen-Vacancy Optical Measurements in Diamond

We realize anti-reflection (AR) coatings for optical excitation and fluorescence measurements of nitrogen-vacancy (NV) color centers in bulk diamond by depositing quarter-wavelength thick silica layers on the diamond surface. These AR coatings improve NV-diamond optical measurements by reducing optical reflection at the diamond-air interface from 17% to 2%, which allows more effective NV optica...

Nanoparticle embedded double-layer coating for daytime radiative cooling

Efficiency Enhancement of Si Solar Cells by Using Nanostructured Single and Double Layer Anti-Reflective Coatings

The effect of single and double-layer anti-reflective coatings on efficiency enhancement of silicon solar cells was investigated. The reflectance of different anti-reflection structures were calculated using the transfer matrix method and then to predict the performance of solar cells coated by these structures, the weighted average reflectance curves were used as an input of a PC1D simulation....